Document Type : Research Paper
Authors
1 Department of Physics, College of Education for Pure Science, University of Anbar, Ramadi, Anbar, Iraq.
2 Department of Physics, College of Education for Pure Science, University of Anbar, Ramadi, Anbar, Iraq
Abstract
In this study, thin films of Zinc Oxide (ZnO) were prepared on glass substrates at a temperature of 350oC using theThermo Chemical Spray Pyrolysis (CSPT) technique. Zinc chloride salts (ZnCl2 (.The structural properties and surface morphology of the CdS thin films were characterized using X-ray diffraction (XRD) and atomic force microscopy (AFM).. Thestructural properties and surface morphology of the ZnO thin films were characterized using X-ray diffraction (XRD) and atomic force microscopy (AFM). The XRD analysis revealed that all the prepared films exhibited a polycrystalline hexagonal structure, with multiple peaks and angles, and a preferred orientation along the (002) direction. The XRD results also indicated that an increase in the solution concentration led to a significant increase in intensity and a slight increase in the crystallite size of the ZnO film. AFM analysis was performed to investigate the surface topography of the films. The results showed that as the molarity increased, the surface roughness, root mean square (RMS), and grain size roughness increased. This can be attributed to the increased molar concentration, which resulted in a slight increase in droplet size. However, despite these surface roughness variations, the prepared films can still be used as windows in solar cells. The optical properties, including transmittance, absorption coefficient, and band gap energy, were determined by measuring the absorbance spectrum using a UV-Visible Spectrophotometer within the wavelength range of 300 nm to 1100 nm. The ZnO prepared films have direct transitions taking place and exhibited transmittance values ranging from approximately
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